I'm reading a technical lab report which study the effect of light and temperature on a silicon wafer. However i'm a bit confused if ambient condition in this case means.
Task 3, Investigate the influence of ambient conditions on the diode characteristics In this task both the silicon wafer and the SiC piece should be utilized. Perform reverse IV sweeps in dark and under illumination. (For the silicon wafer these measurements could be combined with Task 1). Perform measurements at room temperature and at least one selected elevated temperature, focus on the forward characteristics.
- Is this means the effect of light on a piece of silicon?
- or is it the effect of temperature?
- or is it means the effect of both light and temperature on a piece of silicon?